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PV Process Testing Franklin Advanced Materials offers a variety of engineering services targeted to the PV metallization process: Print and screen process studies that link finger topology to print process to cell performance improvements. Cell design comparisons that link finger width and pitch to cell performance. We will be an extension of your production line and engineering resources with our qualified staff and full metallization line. |
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Scanning Electron Microscope The SEM is often used when the needed resolution exceeds the capabilities of an optical microscope. However, beyond showing high resolution topographical information, the SEM is also capable of producing an elemental analysis of the specimen when coupled with an auxiliary Energy Dispersive X-ray Spectroscopy (EDS) detector. Franklin AM has a JEOL JSM-6390LV low vacuum SEM with an Oxford Instruments EDS. We offer our clients fast turnaround and direct person to person service to ensure that you get the information you need when you need it. |
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Surface Topography Our new laser based non-contact inspection system provides high resolution z-height measurements collected to produce either a 2-D profile or 3-D topographical map. The specimen can be opaque, clear or photo reflective / absorptive. Our system is fitted with a blue laser confocal sensor that is designed to allow measurements on silicon solar cells with an anti-reflective coating (ARC).10nm Z resolution, 1 micron X & Y resolution , 1 micron spot size200 micron Z sensor range, 200mm X & Y stage range Height, length, width, diameter, depth, thickness, area, volume, camber, warp, surface roughness/smoothness. |
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Solar Cell Output Testing We can provide performance measurements of Un-tabbed front contact poly or mono crystalline solar cells, in both 156 mm x 156 mm and 127 mm x 127 mm standard sizes. Typical performance measurements include Fill Factor, Efficiency, Voc, Vmax, Imax, n Factor and Isc under single sun conditions. |
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Solid Oxide Fuel Cell Process Testing Franklin Advanced Materials offers a variety of metrology and engineering services targeted to SOFC: Electrochemical Impedance Measurement for Performance Diagnosis SOFC Materials Test System with a variety of Fuels Tape Casting and Screen Printing Research and Production Supporting SOFC, Thick Film and Fuel Technologies |
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Corescan - instrument for mapping of Contact Resistance of front side grid Corescan is used for detailed surface mapping of contact resistance between the emitter and the metallization grid of solar cells. Other standard mapping modes in the instrument are for shunt resistance; short circuit current (LBIC) and open circuit voltage (Voc). Corescan studies are indispensable for optimization of cell efficiency, metallization firing process, trouble shooting and R&D. |